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 February 2007
(R)
AS6C62256
32K X 8 BIT LOW POWER CMOS SRAM
FEATURES
Access time : 55ns Low power consumption: Operation current : 15mA (TYP.), VCC = 3.0V Standby current : 1 A (TYP.), VCC = 3.0V Wide range power supply : 2.7 ~ 5.5V Fully Compatible with all Competitors 5V product Fully Compatible with all Competitors 3.3V product Fully static operation Tri-state output Data retention voltage : 2.0V (MIN.) All products ROHS Compliant Package : 28-pin 600 mil PDIP 28-pin 330 mil SOP 28-pin 8mm x 13.4mm sTSOP
GENERAL DESCRIPTION
The AS6C62256 is a 262,144-bit low power CMOS static random access memory organized as 32,768 words by 8 bits. It is fabricated using very high performance, high reliability CMOS technology. Its standby current is stable within the range of operating temperature. The AS6C62256 is well designed for low power application, and particularly well suited for battery back-up nonvolatile memory application. The AS6C62256 operates with wide range power supply 2.7 ~ 5.5V .
FUNCTIONAL BLOCK DIAGRAM
PIN DESCRIPTION
SYMBOL DESCRIPTION Address Inputs Data Inputs/Outputs Chip Enable Input Write Enable Input Output Enable Input Power Supply Ground A0 - A14 DQ0 - DQ7 CE# WE# OE# VCC VSS
Vcc Vss 32Kx8 MEMORY ARRAY
A0-A14
DECODER
DQ0-DQ7
I/O DATA CIRCUIT
COLUMN I/O
CE# WE# OE#
CONTROL CIRCUIT
02/FEB/07, v1.0
Alliance Memory Inc.
Page 1 of 12
February 2007
(R)
AS6C62256
32K X 8 BIT LOW POWER CMOS SRAM
PIN CONFIGURATION
A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 DQ0 DQ1 DQ2 Vss 1 2 3 4 28 27 26 25 Vcc WE# A13 A8 A9 A11 OE# A10 CE# DQ7 DQ6 DQ5 DQ4 DQ3 OE# A11 A9 A8 A13 WE# Vcc A14 A12 A7 A6 A5 A4 A3 1 2 3 4 5 6 7 8 9 10 11 12 13 14 28 27 26 25 24 23 22 21 20 19 18 17 16 15 A10 CE# DQ7 DQ6 DQ5 DQ4 DQ3 Vss DQ2 DQ1 DQ0 A0 A1 A2
AS6C62256
PDIP/SOP
5 6 7 8 9 10 11 12 13 14
24 23 22 21 20 19 18 17 16 15
AS6C62256
sTSOP
ABSOLUTE MAXIMUM RATINGS*
PARAMETER Terminal Voltage with Respect to VSS Operating Temperature Storage Temperature Power Dissipation DC Output Current Soldering Temperature (under 10 sec) SYMBOL VTERM TA TSTG PD IOUT TSOLDER -40 to 85(I grade) -65 to 150 1 50 260 RATING -0.5 to 7.0 0 to 70(C grade) UNIT V
C C
W mA
*Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect device reliability.
C
TRUTH TABLE
MODE Standby Output Disable Read Write
Note:
CE# H L L L
OE# X H L X
WE# X H H L
I/O OPERATION High-Z High-Z DOUT DIN
SUPPLY CURRENT ISB,ISB1 ICC,ICC1 ICC,ICC1 ICC,ICC1
H = VIH, L = VIL, X = Don't care.
02/FEB/07, v1.0
Alliance Memory Inc.
Page 2 of 12
February 2007
(R)
AS6C62256
32K X 8 BIT LOW POWER CMOS SRAM
DC ELECTRICAL CHARACTERISTICS
SYMBOL TEST CONDITION PARAMETER Supply Voltage VCC *1 Input High Voltage VIH *2 Input Low Voltage VIL Input Leakage Current ILI VCC VIN VSS Output Leakage VCC VOUT VSS, ILO Current Output Disabled Output High Voltage VOH IOH = -1mA Output Low Voltage VOL IOL = 2mA Average Operating Power supply Current ICC ICC1 Standby Power Supply Current ISB ISB1 Cycle time = Min. CE# = VIL , II/O = 0mA -55 MIN. 2.7 0.7*Vcc - 0.5 -1 -1 2.4 TYP. 3.3 3.0 15 3 1 1 1
*5
MAX. 5.5 VCC+0.5 0.6 1 1 0.4 45 10 3 *4 50 *4 80
UNIT V V V A A V V mA . mA mA A A
Cycle time = 1s CE#0.2V and II/O = 0mA other pins at 0.2V or VCC-0.2V CE# = VIH -C CE# VCC - 0.2V -I
Notes: C = Commercial Temperature I = Industrial Temperature 1. VIH(max) = VCC + 3.0V for pulse width less than 10ns. 2. VIL(min) = VSS - 3.0V for pulse width less than 10ns. 3. Over/Undershoot specifications are characterized, not 100% tested. 4. 10A for special request 5. Typical values are included for reference only and are not guaranteed or tested. Typical valued are measured at VCC = VCC(TYP.) and TA = 25C
CAPACITANCE (TA = 25, f = 1.0MHz)
PARAMETER Input Capacitance Input/Output Capacitance SYMBOL CIN CI/O MIN.
Note : These parameters are guaranteed by device characterization, but not production tested.
-
MAX 6 8
UNIT pF pF
AC TEST CONDITIONS
Input Pulse Levels Input Rise and Fall Times Input and Output Timing Reference Levels Output Load 0.2V to VCC - 0.2V 3ns 1.5V CL = 50pF + 1TTL, IOH/IOL = -1mA/2mA
02/FEB/07, v1.0
Alliance Memory Inc.
Page 3 of 12
February 2007
(R)
AS6C62256
32K X 8 BIT LOW POWER CMOS SRAM
AC ELECTRICAL CHARACTERISTICS
(1) READ CYCLE PARAMETER Read Cycle Time Address Access Time Chip Enable Access Time Output Enable Access Time Chip Enable to Output in Low-Z Output Enable to Output in Low-Z Chip Disable to Output in High-Z Output Disable to Output in High-Z Output Hold from Address Change (2) WRITE CYCLE PARAMETER Write Cycle Time Address Valid to End of Write Chip Enable to End of Write Address Set-up Time Write Pulse Width Write Recovery Time Data to Write Time Overlap Data Hold from End of Write Time Output Active from End of Write Write to Output in High-Z SYM tRC tAA tACE tOE tCLZ* tOLZ* tCHZ* tOHZ* tOH AS6C62256-55 MIN MAX. 55 55 55 30 10 5 20 20 10 UNIT ns ns ns ns ns ns ns ns ns
SYM tWC tAW tCW tAS tWP tWR tDW tDH tOW* tWHZ*
*These parameters are guaranteed by device characterization, but not production tested.
AS6C62256-55 MIN. MAX. 55 50 50 0 45 0 25 0 5 20
UNIT ns ns ns ns ns ns ns ns ns ns
02/FEB/07, v1.0
Alliance Memory Inc.
Page 4 of 12
February 2007
(R)
AS6C62256
32K X 8 BIT LOW POWER CMOS SRAM
TIMING WAVEFORMS
READ CYCLE 1 (Address Controlled) (1,2)
tRC Address tAA Dout Previous Data Valid tOH Data Valid
READ CYCLE 2 (CE# and OE# Controlled) (1,3,4,5)
tRC Address tAA CE# tACE OE# tOLZ tOE tOH tOHZ tCHZ Data Valid High-Z
tCLZ Dout High-Z
Notes : 1.WE# is high for read cycle. 2.Device is continuously selected OE# = low, CE# = low. 3.Address must be valid prior to or coincident with CE# = low,; otherwise tAA is the limiting parameter. 4.tCLZ, tOLZ, tCHZ and tOHZ are specified with CL = 5pF. Transition is measured 500mV from steady state. 5.At any given temperature and voltage condition, tCHZ is less than tCLZ , tOHZ is less than tOLZ.
02/FEB/07, v1.0
Alliance Memory Inc.
Page 5 of 12
February 2007
(R)
AS6C62256
32K X 8 BIT LOW POWER CMOS SRAM
WRITE CYCLE 1 (WE# Controlled) (1,2,3,5,6)
tWC Address tAW CE# tCW tAS WE# tWHZ Dout (4) High-Z tDW Din tDH TOW (4) tWP tWR
Data Valid
WRITE CYCLE 2 (CE# Controlled) (1,2,5,6)
tWC Address tAW CE# tAS tCW tWP WE# tWHZ Dout (4) High-Z tDW Din tDH tWR
Data Valid
Notes : 1.WE#, CE# must be high during all address transitions. 2.A write occurs during the overlap of a low CE#, low WE#. 3.During a WE# controlled write cycle with OE# low, tWP must be greater than tWHZ + tDW to allow the drivers to turn off and data to be placed on the bus. 4.During this period, I/O pins are in the output state, and input signals must not be applied. 5.If the CE# low transition occurs simultaneously with or after WE# low transition, the outputs remain in a high impedance state. 6.tOW and tWHZ are specified with CL = 5pF. Transition is measured 500mV from steady state.
02/FEB/07, v1.0
Alliance Memory Inc.
Page 6 of 12
February 2007
(R)
AS6C62256
32K X 8 BIT LOW POWER CMOS SRAM
DATA RETENTION CHARACTERISTICS
PARAMETER VCC for Data Retention Data Retention Current Chip Disable to Data Retention Time Recovery Time tRC* = Read Cycle Time SYMBOL TEST CONDITION VDR CE# VCC - 0.2V VCC = 2.0V IDR CE# VCC - 0.2V See Data Retention tCDR Waveforms (below) tR MIN. 2.0 0 tRC* TYP. 0.5 MAX. 5.5 20 UNIT V A ns ns
DATA RETENTION WAVEFORM
VDR 2.0V Vcc Vcc(min.) tCDR CE# VIH CE# Vcc-0.2V Vcc(min.) tR VIH
02/FEB/07, v1.0
Alliance Memory Inc.
Page 7 of 12
February 2007
(R)
AS6C62256
32K X 8 BIT LOW POWER CMOS SRAM
PACKAGE OUTLINE DIMENSION
28 pin 600 mil PDIP Package Outline Dimension
SYM.
UNIT
INCH.(BASE) 0.010 (MIN) 0.1500.005 0.020 (MAX) 0.055 (MAX) 0.012 (MAX) 1.430 (MAX) 0.6 (TYP) 0.52 (MAX) 0.100 (TYP) 0.625 (MAX) 0.180(MAX) 0.06 (MAX) 0.08(MAX) o 15 (MAX)
MM(REF) 0.254 (MIN) 3.8100.127 0.508(MAX) 1.397(MAX) 0.304 (MAX) 36.322 (MAX) 15.24 (TYP) 13.208 (MAX) 2.540(TYP) 15.87 (MAX) 4.572(MAX) 1.524 (MAX) 2.032(MAX) o 15 (MAX)
A1 A2 B B1 c D E E1 e eB L S Q1
02/FEB/07, v1.0
Alliance Memory Inc.
Page 8 of 12
February 2007
(R)
AS6C62256
32K X 8 BIT LOW POWER CMOS SRAM
28 pin 330 mil SOP Package Outline Dimension
SYM.
UNIT
INCH(BASE) 0.120 (MAX) 0.002(MIN) 0.0980.005 0.016 (TYP) 0.010 (TYP) 0.728 (MAX) 0.340 (MAX) 0.4650.012 0.050 (TYP) 0.05 (MAX) 0.0670.008 0.047 (MAX) 0.003(MAX) o o 0 10
MM(REF) 3.048 (MAX) 0.05(MIN) 2.4890.127 0.406(TYP) 0.254(TYP) 18.491 (MAX) 8.636 (MAX) 11.8110.305 1.270(TYP) 1.270 (MAX) 1.702 0.203 1.194 (MAX) 0.076(MAX) o o 0 10
A A1 A2 b c D E E1 e L L1 S y
02/FEB/07, v1.0
Alliance Memory Inc.
Page 9 of 12
February 2007
(R)
AS6C62256
32K X 8 BIT LOW POWER CMOS SRAM
28 pin 8mm x 13.4mm sTSOP Package Outline Dimension
SYM.
UNIT
INCH(BASE) 0.047 (MAX) 0.0040.002 0.0390.002 0.006 (TYP) 0.010 (TYP) 0.4650.004 0.3150.004 0.022 (TYP) 0.5280.008 0.0200.004 0.03150.004 0.08(MAX) o o 0 5
MM(REF) 1.20 (MAX) 0.100.05 1.000.05 0.15(TYP) 0.254(TYP) 11.800.10 8.000.10 0.55(TYP) 13.400.20 0.500.10 0.800.10 0.003(MAX) o o 0 5
A A1 A2 b c Db E e D L L1 y
NoteE dimension is not including end flash. The total of both sides' end flash is not above 0.3mm.
02/FEB/07, v1.0
Alliance Memory Inc.
Page 10 of 12
February 2007
(R)
AS6C62256
32K X 8 BIT LOW POWER CMOS SRAM
ORDERING INFORMATION
Ordering Codes
Alliance AS6C62256-55PCN AS6C62256-55SCN AS6C62256-55SIN AS6C62256-55STCN AS6C62256-55STIN Organization VCC range 32k x 8 32k x 8 32k x 8 32k x 8 32k x 8 2.7-5.5V 2.7-5.5V 2.7-5.5V 2.7-5.5V 2.7-5.5V Package 28pin 600mil PDIP 28pin 330mil SOP 28pin 330mil SOP 28pin sTSOP (8 x 13.4 mm) 28pin sTSOP (8 x 13.4 mm) Operating Speed Temp ns Commercial ~ 0 C to 70 C 55 Commercial ~ 0 C to 70 C 55 Industrial ~ -40C to 85 C 55 Commercial ~ 0 C to 70 C 55 Industrial ~ -40C to 85 C 55
Part numbering system
AS6C
62256
- 55
X
X
N
low Device power Number SRAM 62256 prefix
Package Options: P = 28 pin 600 mil P-DIP Access S = 28 pin 330 mil SOP Time ST = 28 pin sTSOP (8mm x 13.4 mm)
Temperature Range: C = Commercial N = Lead (0C to +70 C) Free ROHS I = Industrial Compliant (-40 to +85 C) Part
02/FEB/07, v1.0
Alliance Memory Inc.
Page 11 of 12
February 2007
AS6C62256
Rev 1
(R)
(R)
Alliance Memory, Inc. 1116 South Amphlett, #2, San Mateo, CA 94402 Tel: 650-525-3737 Fax: 650-525-0449 www.alliancememory.com
Copyright (c) Alliance Memory All Rights Reserved Part Number: AS6C62256 Document Version: v. 1.0
(c) Copyright 2003 Alliance Memory, Inc. All rights reserved. Our three-point logo, our name and Intelliwatt are trademarks or registered trademarks of Alliance. All other brand and product names may be the trademarks of their respective companies. Alliance reserves the right to make changes to this document and its products at any time without notice. Alliance assumes no responsibility for any errors that may appear in this document. The data contained herein represents Alliance's best data and/or estimates at the time of issuance. Alliance reserves the right to change or correct this data at any time, without notice. If the product described herein is under development, significant changes to these specifications are possible. The information in this product data sheet is intended to be general descriptive information for potential customers and users, and is not intended to operate as, or provide, any guarantee or warrantee to any user or customer. Alliance does not assume any responsibility or liability arising out of the application or use of any product described herein, and disclaims any express or implied warranties related to the sale and/or use of Alliance products including liability or warranties related to fitness for a particular purpose, merchantability, or infringement of any intellectual property rights, except as express agreed to in Alliance's Terms and Conditions of Sale (which are available from Alliance). All sales of Alliance products are made exclusively according to Alliance's Terms and Conditions of Sale. The purchase of products from Alliance does not convey a license under any patent rights, copyrights; mask works rights, trademarks, or any other intellectual property rights of Alliance or third parties. Alliance does not authorize its products for use as critical components in life-supporting systems where a malfunction or failure may reasonably be expected to result in significant injury to the user, and the inclusion of Alliance products in such life-supporting systems implies that the manufacturer assumes all risk of such use and agrees to indemnify Alliance against all claims arising from such use.
02/FEB/07, v1.0
Alliance Memory Inc.
Page 12 of 12


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